Metals & Alloys

Description

With its high-sensitivity and high-temperature (up to 2400°C) thermal analyzers, SETARAM offers a wide range of systems that are specially designed for R & D on metals and alloys. Additional accessories and systems allow thermal measurements in special atmospheres (oxidative, damp, corrosive, etc.).

Associated products

1 instrument, 3 methods for thermal conductivity

TransparentTrident

Trident

MODIFIED TRANSIENT PLANE  SOURCE ( MTPS ) Simple and precise. The MTPS method employs a single-sided sensor to directly measure thermal conductivity and effusivity of materials. The MTPS method has the highest precision, highest sensitivity, shortest test time, and is the easiest to use among all three techniques....

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TransparentCTHERMTx

TX

TX Touch Experience Platform – The fastest, easiest way to measure thermal conductivity and effusivity The C-Therm TCi employs the patented Modified Transient Plane Source (MTPS) technique. The one-sided, interfacial heat reflectance sensor applies a momentary constant heat source to the sample. Thermal conductivity and effusivity are measured directly, providing a detailed overview of the...

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Silmultaneous Thermal Analysis Platform (STA) with Evolved Gas Analysis (EGA) from ambient to 1600°C

THEMYS 2017 3-4- OK

THEMYS TGA/STA-EGA (Evolved Gas Analysis)

  The THEMYS is the NEW benchmark for modular thermogravimetric analysis. The THEMYS is available in various platforms: Standard Thermogravimetric Analysis (TGA), high pressure TGA, Simultaneous Thermal Analysis (STA) TG/DSC, Differential Thermal Analysis / Differential Scanning Calorimetry (DTA/DSC), and Evolved Gas...

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THEMYS 2017 3-4- OK

THEMYS STA (Simultaneous Thermal Analysis)

Simultaneous Thermal Analyzer (TGA/DSC – DTA) up to 1750°C The THEMYS is the NEW benchmark for modular thermogravimetric analysis. The THEMYS is available in various platforms: Standard Thermogravimetric Analysis (TGA), high pressure TGA, Simultaneous Thermal Analysis (STA) TG/DSC, Differential Thermal Analysis / Differential Scanning Calorimetry (DTA/DSC), and Evolved Gas Analysis (EGA). The design of the...

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TGA-EGA and Simultaneous STA-EGA, from ambient to 1150°C or 1600°C

Labsys 3-4

LABSYS evo TGA/STA-EGA

THE HIGHLIGHTS Simplicity of use: thanks to both an ergonomic design and the dedicated market leading Calisto software, LABSYS evo is user friendly and intuitive to operate – LABSYS evo offers a “Plug & play” gas analyzer coupling device,enabling simultaneous MS, FTIR or GC/MS connections....

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TGA, and Simultaneous TGA-DTA, TGA-DSC from ambient to 1150°C or 1600°C

Labsys 3-4

LABSYS evo STA

LABSYS evo is a user friendly, robust and highly powerful thermal analysis platform. HIGHLIGHTS include: • A comprehensive line of thermal analyzers with two temperature ranges chosen and optimized for distinct families of application: – RT – 1 150 °C, a cost effective solution...

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DTA, DSC from ambient to 1150°C or 1600°C

Labsys 3-4

LABSYS evo DTA/DSC

LABSYS evo is a user friendly, robust and highly powerful thermal analysis platform. HIGHLIGHTS include: • A comprehensive line of thermal analyzers with two temperature ranges chosen and optimized for distinct families of application: – RT – 1 150 °C, a cost effective solution mostly (but not...

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TGA, from ambient to 1150°C or 1600°C

Labsys 3-4

LABSYS evo TGA

LABSYS evo is a user friendly, robust and highly powerful thermal analysis platform. HIGHLIGHTS include: • A comprehensive line of thermal analyzers with two temperature ranges chosen and optimized for distinct families of application: – RT – 1 150 °C, a cost effective solution mostly (but not only)...

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Horizontal dilatometer (room temperature / 1200°C)

C-therm dilatometer

C-Therm Dilatometer

The HIGHLIGHT: C-Therm dilatometers offer high resolution and stability across a broad measurement range. With unparalleled ease-of-use, high adaptability, and modular design, C-Therm dilatometers offer researchers a robust cost-effective solution to their characterization needs.   See also: SETSYS Evolution TMA, TCi

Documentation

Application notes
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